TY - JOUR
T1 - Digital detection of analog parametric faults in SC filters
AU - Harjani, Ramesh
AU - Vinnakota, Bapiraju
PY - 1999
Y1 - 1999
N2 - Many design for test techniques for analog circuits are ineffective at detecting multiple parametric faults because either their accuracy is poor, or the circuit is not tested in the configuration it is used in. We present a DFT scheme that offers the accuracy needed to test high-quality circuits. The DFT scheme is based on a circuit that digitally measures the ratio of a pair of capacitors. The circuit is used to completely characterize the transfer function of a switched capacitor circuit, which is usually determined by capacitor ratios. In our DFT scheme, capacitor ratios can be measured to within 0.01% accuracy, and filter parameters can be shown to be satisfied to within 0.1% accuracy. A filter can be shown to satisfy all its functional specifications through this characterization process. We believe the accuracy of our scheme is at least an order of magnitude greater than that offered by any other scheme reported in the literature.
AB - Many design for test techniques for analog circuits are ineffective at detecting multiple parametric faults because either their accuracy is poor, or the circuit is not tested in the configuration it is used in. We present a DFT scheme that offers the accuracy needed to test high-quality circuits. The DFT scheme is based on a circuit that digitally measures the ratio of a pair of capacitors. The circuit is used to completely characterize the transfer function of a switched capacitor circuit, which is usually determined by capacitor ratios. In our DFT scheme, capacitor ratios can be measured to within 0.01% accuracy, and filter parameters can be shown to be satisfied to within 0.1% accuracy. A filter can be shown to satisfy all its functional specifications through this characterization process. We believe the accuracy of our scheme is at least an order of magnitude greater than that offered by any other scheme reported in the literature.
UR - http://www.scopus.com/inward/record.url?scp=0032681540&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0032681540&partnerID=8YFLogxK
U2 - 10.1145/309847.310056
DO - 10.1145/309847.310056
M3 - Conference article
AN - SCOPUS:0032681540
SN - 0738-100X
SP - 772
EP - 777
JO - Proceedings - Design Automation Conference
JF - Proceedings - Design Automation Conference
T2 - 36th Annual Design Automation Conference, DAC 1999
Y2 - 21 June 1999 through 25 June 1999
ER -