Skip to main navigation
Skip to search
Skip to main content
Experts@Minnesota Home
Home
Profiles
Research units
University Assets
Projects and Grants
Research output
Press/Media
Datasets
Activities
Fellowships, Honors, and Prizes
Search by expertise, name or affiliation
Dynamic V
TH
scaling scheme for active leakage power reduction
C. H. Kim
, K. Roy
Electrical and Computer Engineering
Research output
:
Contribution to journal
›
Conference article
›
peer-review
95
Scopus citations
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Dynamic V
TH
scaling scheme for active leakage power reduction'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Engineering & Materials Science
Voltage scaling
100%
Networks (circuits)
87%
Threshold voltage
87%
Clocks
67%
Energy conservation
63%
Feedback
50%
Computer hardware
46%
Electric potential
41%