Abstract
This paper presents a Dynamic Vt SRAM (DTSRAM) architecture to reduce the subthreshold leakage in cache memories. The Vt of each cache line is controlled separately by means of body biasing. In order to minimize the energy and delay overhead, a cache line is switched to high Vt only when it is not likely to be accessed anymore. Simulation results from SimpleScalar framework show that even after considering the energy overhead, the DTSRAM can save 72% of the cache leakage with a performance loss less than 1%. Layout of the DTSRAM shows that the area penalty is minimal.
Original language | English (US) |
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Title of host publication | Proceedings of the International Symposium on Low Power Electronics and Design, Digest of Technical Papers |
Pages | 251-254 |
Number of pages | 4 |
State | Published - Dec 1 2002 |
Event | Proceedings of the 2002 International Symposium on Low Power Electronics and Design - Monterey, CA, United States Duration: Aug 12 2002 → Aug 14 2002 |
Other
Other | Proceedings of the 2002 International Symposium on Low Power Electronics and Design |
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Country/Territory | United States |
City | Monterey, CA |
Period | 8/12/02 → 8/14/02 |