Effect of growth induced (non)stoichiometry on the structure, dielectric response, and thermal conductivity of SrTiO ₃ thin films

Engineering & Materials Science

• Stoichiometry 94%
• Positive ions 87%
• Thin films 66%
• Rutherford backscattering spectroscopy 65%
• Strain relaxation 59%
• Defect structures 55%
• Pulsed laser deposition 54%
• Spectrometry 45%
• X ray photoelectron spectroscopy 42%
• Dielectric properties 42%
• Structural properties 37%
• Permittivity 35%
• X ray diffraction 34%
• Thermodynamic properties 32%
• Relaxation 32%
• Lasers 26%
• Chemical analysis 22%
• Geometry 21%

Chemical Compounds

• Dielectric Response 100%
• Thermal Conductivity 66%
• Reaction Stoichiometry 56%
• Pulsed Laser Deposition 46%
• Rutherford Backscattering Spectroscopy 44%
• Percent Reduction 41%
• Crystal Defect 41%
• Cation 40%
• Dielectric Property 35%
• Dielectric Constant 32%
• X-Ray Photoelectron Spectroscopy 24%
• Strain 24%
• Probe 21%
• X-Ray Diffraction 17%
• Liquid Film 16%