Abstract
The high pressures generated at a contact during nanoindentation have a quantifiable effect on the measured indentation modulus. This effect can be accounted for by invoking a Murnaghan equation of state-based analysis where the measured indentation modulus is a function of the hydrostatic component of the stress state which is generated beneath the indenter tip. This approach has implications pertinent to a range of mechanical characterization techniques that include instrumented indentation and quantitative atomic force microscopy (AFM) since these techniques traditionally consider only zero-pressure modulus values during data interpretation. To demonstrate the validity of this approach, the indentation modulus of four materials (fused quartz, sapphire, rutile and silicon) is evaluated using a 1 μm radius conospherical diamond tip to maximum contact depths of 30 nm. The tip area function is independently determined via AFM while the unloading stiffness from the load-displacement data is determined using standard Oliver-Pharr analysis.
Original language | English (US) |
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Title of host publication | Materials Research Society Symposium Proceedings - Fundamentals of Nanoindentation and Nanotribology IV |
Pages | 21-26 |
Number of pages | 6 |
Volume | 1049 |
State | Published - Nov 7 2008 |
Event | Fundamentals of Nanoindentation and Nanotribology IV held at the 2007 MRS Fall Meeting - Boston, MA, United States Duration: Nov 26 2007 → Nov 29 2007 |
Other
Other | Fundamentals of Nanoindentation and Nanotribology IV held at the 2007 MRS Fall Meeting |
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Country/Territory | United States |
City | Boston, MA |
Period | 11/26/07 → 11/29/07 |