Abstract
Ellipsometry was used to investigate the effects of temperature and potential on the growth kinetics of passive films on iron exposed to a pH 8.6 borate buffer solution. It was found that over the temperature range of 0°-80°C the growth kinetics could be described with an equal degree of confidence by either logarithmic, inverse logarithmic, or a modified form of inverse logarithmic kinetics. None of the existing models for film growth were found to be completely consistent with the temperature and potential dependencies of the growth constants.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1571-1579 |
| Number of pages | 9 |
| Journal | Journal of the Electrochemical Society |
| Volume | 122 |
| Issue number | 12 |
| DOIs | |
| State | Published - Dec 1975 |
| Externally published | Yes |
Keywords
- corrosion
- ellipsometry
- film
- iron
- passivity