Electron and hole mobility enhancement in strained SOI by wafer bonding

Lijuan Huang, Jack O. Chu, S. A. Goma, C. P. D'Emic, Steven J. Koester, Donald F. Canaperi, Patricia M. Mooney, S. A. Cordes, James L. Speidell, R. M. Anderson, H. S.Philip Wong

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