Electron diffraction and weak‐beam imaging techniques were used to examine the structure and thickness of grain boundaries in polycrystalline Al2O3. Extra diffraction spots from boundaries inclined to the foil surface were detected and related to the periodic structure of the boundary. Relrods from edge‐on boundaries were detected and used to estimate the thickness of the boundary region, i.e. the depth that the displacement field of the boundary penetrates into the two crystals adjacent to the interface.
|Original language||English (US)|
|Number of pages||5|
|Journal||Journal of the American Ceramic Society|
|State||Published - Nov 1980|