Evidence of bilayer structure in V2O5 xerogel

Marco Giorgetti; Stefano Passerini; William H. Smyrl; Mario Berrettoni

doi:10.1021/ic9913233

Evidence of bilayer structure in V₂O₅ xerogel

Marco Giorgetti, Stefano Passerini, William H. Smyrl, Mario Berrettoni

Chemical Engineering and Materials Science

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Abstract

Polarized X-ray absorption spectroscopy has been used to study the short-range structure of deposited films of V₂O₅ xerogel. The material is characterized by a layer of VO₅ units with the V-O apical bond perpendicular to the basal (xy) plane. We have focused our attention along the z axis. Experiments were carried out by extended X-ray absorption fine structure (EXAFS) spectroscopy in a grazing incidence geometry and showed evidence for close interactions between neighboring layers of V₂O₅. The structure is described by two sheets of V₂O₅ facing each other. Fitting of the EXAFS data has confirmed the existence of a vanadium-vanadium interaction between two different V₂O₅ layers and an oxygen bridge between them.

Original language	English (US)
Pages (from-to)	1514-1517
Number of pages	4
Journal	Inorganic Chemistry
Volume	39
Issue number	7
DOIs	https://doi.org/10.1021/ic9913233
State	Published - Apr 3 2000

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abstract = "Polarized X-ray absorption spectroscopy has been used to study the short-range structure of deposited films of V2O5 xerogel. The material is characterized by a layer of VO5 units with the V-O apical bond perpendicular to the basal (xy) plane. We have focused our attention along the z axis. Experiments were carried out by extended X-ray absorption fine structure (EXAFS) spectroscopy in a grazing incidence geometry and showed evidence for close interactions between neighboring layers of V2O5. The structure is described by two sheets of V2O5 facing each other. Fitting of the EXAFS data has confirmed the existence of a vanadium-vanadium interaction between two different V2O5 layers and an oxygen bridge between them.",

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AU - Giorgetti, Marco

AU - Passerini, Stefano

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AU - Berrettoni, Mario

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AB - Polarized X-ray absorption spectroscopy has been used to study the short-range structure of deposited films of V2O5 xerogel. The material is characterized by a layer of VO5 units with the V-O apical bond perpendicular to the basal (xy) plane. We have focused our attention along the z axis. Experiments were carried out by extended X-ray absorption fine structure (EXAFS) spectroscopy in a grazing incidence geometry and showed evidence for close interactions between neighboring layers of V2O5. The structure is described by two sheets of V2O5 facing each other. Fitting of the EXAFS data has confirmed the existence of a vanadium-vanadium interaction between two different V2O5 layers and an oxygen bridge between them.

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Evidence of bilayer structure in V₂O₅ xerogel

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