Femtosecond TEM: Imaging nanoscale materials dynamics at temporal extremes

David Flannigan, Ryan Gnabasik, Yichao Zhang

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English (US)
Journal	Microscopy and Microanalysis
DOIs	https://doi.org/10.1017/S143192762001702X
State	Accepted/In press - 2020

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title = "Femtosecond TEM: Imaging nanoscale materials dynamics at temporal extremes",

author = "David Flannigan and Ryan Gnabasik and Yichao Zhang",

year = "2020",

doi = "10.1017/S143192762001702X",

language = "English (US)",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

}

TY - JOUR

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T2 - Imaging nanoscale materials dynamics at temporal extremes

AU - Flannigan, David

AU - Gnabasik, Ryan

AU - Zhang, Yichao

PY - 2020

Y1 - 2020

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U2 - 10.1017/S143192762001702X

DO - 10.1017/S143192762001702X

M3 - Comment/debate

AN - SCOPUS:85094841220

SN - 1431-9276

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -