Full recovery of electron damage in glass at ambient temperatures

K. A. Mkhoyan, J. Silcox, A. Ellison, D. Ast, R. Dieckmann

Research output: Contribution to journalArticlepeer-review

23 Scopus citations

Abstract

An unusually complete recovery of extensive electron-beam-induced damage in a thin film of a CaO-Al2O3-SiO2 glass was discovered. Nanoscale measurements show that the Ca ions migrate about 10 nm away during irradiation and return during recovery. Oxygen atoms are trapped largely as molecular oxygen and do not migrate. Electron energy loss measurements demonstrate that the glass returns completely to the original compositional and structural state thus indicating that the glass is in a deep thermodynamic energy minimum.

Original languageEnglish (US)
Article number205506
JournalPhysical review letters
Volume96
Issue number20
DOIs
StatePublished - 2006

Fingerprint

Dive into the research topics of 'Full recovery of electron damage in glass at ambient temperatures'. Together they form a unique fingerprint.

Cite this