Germanium-on-insulator photodetectors

S. J. Koester, G. Dehlinger, J. D. Schaub, J. O. Chu, Q. C. Ouyang, A. Grill

Research output: Chapter in Book/Report/Conference proceedingConference contribution

25 Scopus citations

Abstract

This paper provides an overview of IBM's recent results on Ge-on-insulator (GOT) photodetector technology and describes their suitability for use in so-called "in-the-box" massively-parallel optical interconnects.

Original languageEnglish (US)
Title of host publication2005 IEEE International Conference on Group IV Photonics
Pages171-173
Number of pages3
DOIs
StatePublished - 2005
Event2005 IEEE International Conference on Group IV Photonics - Antwerp, Belgium
Duration: Sep 21 2005Sep 23 2005

Publication series

Name2005 IEEE International Conference on Group IV Photonics
Volume2005

Other

Other2005 IEEE International Conference on Group IV Photonics
Country/TerritoryBelgium
CityAntwerp
Period9/21/059/23/05

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