Growth of DyBa2Cu3O7-x studied by scanning tunneling microscopy

N. Chandrasekhar, V. Agrawal, V. S. Achutharaman, A. M. Goldman

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Abstract

Scanning tunneling microscopy (STM) has been used to investigate the microstructure of DyBa2Cu3O7-x films grown on (100) SrTiO3 by ozone-assisted molecular beam epitaxy. The surface roughness is found to be higher than that reported for sputtered films of YBa2Cu3O7-x. Intensity oscillations were observed in the specular spot of in situ reflection high energy electron diffraction patterns, a result which suggests that surface smoothness is not a requisite for the observation of such intensity oscillations. The observation of spiral morphology in STM pictures indicates the presence of screw dislocations, in excess of 109 cm-2. A zeroth order approximation has been used to evaluate the shapes of the spirals and reasonable agreement is obtained with experiment.

Original languageEnglish (US)
Pages (from-to)2424-2426
Number of pages3
JournalApplied Physics Letters
Volume60
Issue number19
DOIs
StatePublished - 1992

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