Guest editors' introduction: Nanoscale memories pose unique challenges

Chris H. Kim; Leland Chang

doi:10.1109/MDT.2011.21

Guest editors' introduction: Nanoscale memories pose unique challenges

Chris H. Kim, Leland Chang

Electrical and Computer Engineering

Research output: Contribution to journal › Editorial › peer-review

3 Scopus citations

Original language	English (US)
Article number	5708256
Pages (from-to)	6-8
Number of pages	3
Journal	IEEE Design and Test of Computers
Volume	28
Issue number	1
DOIs	https://doi.org/10.1109/MDT.2011.21
State	Published - Jan 2011

Keywords

DRAM
FeRAM
MRAM
PCRAM
SRAM
STT-RAM
design and test
eDRAM
embedded memories

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title = "Guest editors' introduction: Nanoscale memories pose unique challenges",

keywords = "DRAM, FeRAM, MRAM, PCRAM, SRAM, STT-RAM, design and test, eDRAM, embedded memories",

author = "Kim, {Chris H.} and Leland Chang",

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Guest editors' introduction: Nanoscale memories pose unique challenges

Keywords

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