Guest editors' introduction: Nanoscale memories pose unique challenges

Chris H. Kim, Leland Chang

Research output: Contribution to journalEditorialpeer-review

3 Scopus citations
Original languageEnglish (US)
Article number5708256
Pages (from-to)6-8
Number of pages3
JournalIEEE Design and Test of Computers
Volume28
Issue number1
DOIs
StatePublished - Jan 1 2011

Keywords

  • DRAM
  • FeRAM
  • MRAM
  • PCRAM
  • SRAM
  • STT-RAM
  • design and test
  • eDRAM
  • embedded memories

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