High-resolution electron imaging of amorphous layers with aberration-corrected probes

S. Maccagnano-Zacher, A. Mkhoyan, J. Silcox

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)940-941
Number of pages2
JournalMicroscopy and Microanalysis
Volume14
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 1 2008

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