A modified near-field optical microscope (NSOM) was used to locate reactive sites on polycrystalline titanium immersed in sulfuric acid. Photoelectrochemical imaging was carried out on the NSOM by using a new shear-force feedback method. PEM with simultaneous independent topography (using the tuning fork method) resolved submicron features at reactive sites at inclusions and grain boundaries. Both PEM and topographic images were obtained in-situ with high lateral resolution by using specially fabricated tips with 100 nm aperture.
|Original language||English (US)|
|Number of pages||7|
|State||Published - Jun 1 1999|
|Event||Proceedings of the 1999 2nd International Symposium on Electrochemical Microsystems Technologies - Electrochemical Applications of Microtechnology - Grevenbroich, Ger|
Duration: Sep 9 1999 → Sep 11 1999
Bibliographical noteFunding Information:
This study was supported by NSF grant DMR-9509766. Early developments of the new technique were made by Drs PS Moyer and PI James.
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