A theoretical and experimental investigation was made of the influence of fluctuations of the solid-solution composition of the hopping conduction. The experiments were carried out on gallium-doped Ge//1// minus //xSi//x solid solutions with 0 less than x less than equivalent to 0. 06. The dependence of the activation energy of hopping conduction on x is explained by two mechanisms which give rise to a scatter of levels. One of them associated with large-scale fluctuations of the value of x in the bulk of the sample and the other is due to fluctuations of the central cell potential.
|Original language||English (US)|
|Number of pages||5|
|Journal||Sov Phys Semicond|
|State||Published - Jan 1 1975|