Hysteresis models of dynamic mode atomic force microscopes: Analysis and identification via harmonic balance

Michele Basso; Donatello Materassi; Murti Salapaka

doi:10.1007/s11071-007-9329-8

Hysteresis models of dynamic mode atomic force microscopes: Analysis and identification via harmonic balance

Michele Basso, Donatello Materassi, Murti Salapaka

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

A new class of models based on hysteresis functions is developed to describe the operation of dynamic mode atomic force microscopy. Such models can account for dissipative phenomena affecting the interaction between the probe and the sample. The model analysis, which is developed using frequency domain techniques, provides a insights into experimentally observed behavior. Experimental data corroborates the models developed.

Original language	English (US)
Pages (from-to)	297-306
Number of pages	10
Journal	Nonlinear Dynamics
Volume	54
Issue number	4
DOIs	https://doi.org/10.1007/s11071-007-9329-8
State	Published - Dec 2008

Bibliographical note

Funding Information:
Acknowledgements This work was partially supported by the NSF grant CMS-0626171.

Keywords

Atomic force microscopy
Harmonic balance
Hysteresis
Identification
Lur'e system
Nanotechnology

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10.1007/s11071-007-9329-8

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abstract = "A new class of models based on hysteresis functions is developed to describe the operation of dynamic mode atomic force microscopy. Such models can account for dissipative phenomena affecting the interaction between the probe and the sample. The model analysis, which is developed using frequency domain techniques, provides a insights into experimentally observed behavior. Experimental data corroborates the models developed.",

keywords = "Atomic force microscopy, Harmonic balance, Hysteresis, Identification, Lur'e system, Nanotechnology",

author = "Michele Basso and Donatello Materassi and Murti Salapaka",

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AU - Materassi, Donatello

AU - Salapaka, Murti

N1 - Funding Information: Acknowledgements This work was partially supported by the NSF grant CMS-0626171.

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AB - A new class of models based on hysteresis functions is developed to describe the operation of dynamic mode atomic force microscopy. Such models can account for dissipative phenomena affecting the interaction between the probe and the sample. The model analysis, which is developed using frequency domain techniques, provides a insights into experimentally observed behavior. Experimental data corroborates the models developed.

KW - Atomic force microscopy

KW - Harmonic balance

KW - Hysteresis

KW - Identification

KW - Lur'e system

KW - Nanotechnology

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JO - Nonlinear Dynamics

JF - Nonlinear Dynamics

SN - 0924-090X

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Hysteresis models of dynamic mode atomic force microscopes: Analysis and identification via harmonic balance

Abstract

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