Identification of interaction potentials in dynamic mode atomic force microscopy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Atomic Force Microscopes (AFMs) are devices employed in many nanotechnology fields for nanoscale imaging and surface manipulation at the atomic level. The interaction potential between the cantilever tip and the sample is typically obtained using force curves. Each force curve involves an approach and retract phase and the entire process is relatively slow. In this paper we present the non-parametric identification of the tip-sample interaction potential that has the potential to significantly reduce the time when compared to force curves.

Original languageEnglish (US)
Title of host publicationProceedings of the 45th IEEE Conference on Decision and Control 2006, CDC
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages3702-3705
Number of pages4
ISBN (Print)1424401712, 9781424401710
DOIs
StatePublished - Jan 1 2006
Event45th IEEE Conference on Decision and Control 2006, CDC - San Diego, CA, United States
Duration: Dec 13 2006Dec 15 2006

Publication series

NameProceedings of the IEEE Conference on Decision and Control
ISSN (Print)0191-2216

Other

Other45th IEEE Conference on Decision and Control 2006, CDC
CountryUnited States
CitySan Diego, CA
Period12/13/0612/15/06

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