Profile analysis via multidimensional scaling (PAMS) is described. It is a technique for studying the most prominent profiles of a battery of measures in a given population. Results of PAMS are reported for 2 well-known test batteries: the Wechsler Adult Intelligence Scale-Revised and the General Aptitude Test Battery. For each inventory, the profiles found in the PAMS analysis are discussed in light of major profiles used in the interpretation of that inventory. Finally, methodological features of the PAMS approach are discussed.