Impact of micromirror seidel aberrations on microcavity spectra

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The stress-induced deformation of micromirrors is examined in terms of common Seidel aberrations, and its impact on microcavity spectra is quantified. Tilt, curvature, and astigmatism cause characteristic changes in the spectra, but coma and spherical aberration are often negligible.

Original languageEnglish (US)
Title of host publicationIEEE/LEOS International Conference on Optical MEMS and Their Applications Conference, 2006
Pages58-59
Number of pages2
StatePublished - Dec 1 2006
EventIEEE/LEOS International Conference on Optical MEMS and Their Applications Conference, 2006 - Big Sky, MT, United States
Duration: Aug 21 2006Aug 24 2006

Publication series

NameIEEE/LEOS International Conference on Optical MEMS and Their Applications Conference, 2006

Other

OtherIEEE/LEOS International Conference on Optical MEMS and Their Applications Conference, 2006
CountryUnited States
CityBig Sky, MT
Period8/21/068/24/06

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