TY - GEN
T1 - Impact of micromirror seidel aberrations on microcavity spectra
AU - Liu, Wei
AU - Talghader, Joseph J.
PY - 2006/12/1
Y1 - 2006/12/1
N2 - The stress-induced deformation of micromirrors is examined in terms of common Seidel aberrations, and its impact on microcavity spectra is quantified. Tilt, curvature, and astigmatism cause characteristic changes in the spectra, but coma and spherical aberration are often negligible.
AB - The stress-induced deformation of micromirrors is examined in terms of common Seidel aberrations, and its impact on microcavity spectra is quantified. Tilt, curvature, and astigmatism cause characteristic changes in the spectra, but coma and spherical aberration are often negligible.
UR - http://www.scopus.com/inward/record.url?scp=41549151312&partnerID=8YFLogxK
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M3 - Conference contribution
AN - SCOPUS:41549151312
SN - 078039562X
SN - 9780780395626
T3 - IEEE/LEOS International Conference on Optical MEMS and Their Applications Conference, 2006
SP - 58
EP - 59
BT - IEEE/LEOS International Conference on Optical MEMS and Their Applications Conference, 2006
T2 - IEEE/LEOS International Conference on Optical MEMS and Their Applications Conference, 2006
Y2 - 21 August 2006 through 24 August 2006
ER -