In-situ and Ex-situ TEM Characterization of Domain Wall-Defect Interactions Using Applied DC Bias in Bismuth Ferrite Thin Films

M. L. Jablonski, C. R. Winkler, Anoop R Damodaran, J. Karthik, J. G. Wen, D. J. Miller, L. W. Martin, M. L. Taheri

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)1462-1463
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberS2
StatePublished - Jul 2012
Externally publishedYes

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