Original language | English (US) |
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Pages (from-to) | 1462-1463 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 18 |
Issue number | S2 |
DOIs | |
State | Published - Jul 2012 |
Externally published | Yes |
In-situ and Ex-situ TEM Characterization of Domain Wall-Defect Interactions Using Applied DC Bias in Bismuth Ferrite Thin Films
M. L. Jablonski, C. R. Winkler, A. R. Damodaran, J. Karthik, J. G. Wen, D. J. Miller, L. W. Martin, M. L. Taheri
Research output: Contribution to journal › Article › peer-review