TY - JOUR
T1 - In situ stress measurement apparatus for liquid applied coatings
AU - Payne, Jason A.
AU - McCormick, Alon V.
AU - Francis, Lorraine F.
PY - 1997/12
Y1 - 1997/12
N2 - An apparatus for measuring stress development in polymer and ceramic coatings is described. The device combines the coating, processing (chilling, curing, drying), and stress measurement steps necessary to accurately monitor stress development in situ. The measurement system was developed to study the effects of processing variables (e.g., temperature, air flow, relative humidity, etc.) on stress development in coatings ranging from solvent-cast polymers and particulate films to radiation-cured materials. The combination of coating, processing, and stress measurement allows us to mimic conditions used in an industrial setting. Results are reported for polyisobutyl methacrylate cast in toluene and aqueous gelatin coatings that demonstrate the utility of the apparatus in studying how stress evolution and magnitude relate to different process controls.
AB - An apparatus for measuring stress development in polymer and ceramic coatings is described. The device combines the coating, processing (chilling, curing, drying), and stress measurement steps necessary to accurately monitor stress development in situ. The measurement system was developed to study the effects of processing variables (e.g., temperature, air flow, relative humidity, etc.) on stress development in coatings ranging from solvent-cast polymers and particulate films to radiation-cured materials. The combination of coating, processing, and stress measurement allows us to mimic conditions used in an industrial setting. Results are reported for polyisobutyl methacrylate cast in toluene and aqueous gelatin coatings that demonstrate the utility of the apparatus in studying how stress evolution and magnitude relate to different process controls.
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U2 - 10.1063/1.1148432
DO - 10.1063/1.1148432
M3 - Article
AN - SCOPUS:0000760853
SN - 0034-6748
VL - 68
SP - 4564
EP - 4568
JO - Review of Scientific Instruments
JF - Review of Scientific Instruments
IS - 12
ER -