The yield behavior in a freestanding sputter-deposited Cu/Nb multilayer with 30 nm nominal individual layer thickness has been investigated with in situ synchrotron x-ray diffraction during tensile loading. A pronounced elastic-plastic transition is observed with the fraction of plastically yielded grains increasing gradually with strain. Near synchronous yielding is observed in the Cu and Nb grains. The gradual progression in yield behavior is interpreted in terms of residual stresses, and elastic and plastic anisotropy.
Bibliographical noteFunding Information:
C.C.A. acknowledges the support of NNSA’s Laboratory Directed Research and Development Program, the experimental assistance of Y.-C. Wang, J. Kevin Baldwin, J. J. Wall, and U. Lienert, and discussion with R. G. Hoagland and J. P. Hirth. Use of the Advanced Photon Source was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02–06CH11357. A.M. and his LANL collaborators acknowledge support from DOE, Office of Science, Office of Basic Energy Sciences.