TY - GEN
T1 - Leakage modeling for devices with steep sub-threshold slope considering random threshold variations
AU - Paul, Ayan
AU - Kshirsagar, Chaitanya
AU - Sapatnekar, Sachin S.
AU - Koester, Steven
AU - Kim, Chris H.
PY - 2014
Y1 - 2014
N2 - In this paper we propose a generic approach to statistically model leakage variation of devices with steep sub-threshold slope caused by random threshold variations. Monte Carlo simulation results based on our model show less than 11% error in 6σ leakage current estimation compared to 65% error using conventional square root method. A design example based on SRAM bit line leakage issue is also presented to show the correctness of our model in a realistic circuit scenario. This general-purpose modeling technique could be a useful tool in estimating leakage in a variety emerging device technology.
AB - In this paper we propose a generic approach to statistically model leakage variation of devices with steep sub-threshold slope caused by random threshold variations. Monte Carlo simulation results based on our model show less than 11% error in 6σ leakage current estimation compared to 65% error using conventional square root method. A design example based on SRAM bit line leakage issue is also presented to show the correctness of our model in a realistic circuit scenario. This general-purpose modeling technique could be a useful tool in estimating leakage in a variety emerging device technology.
KW - Leakage current
KW - Monte Carlo simulation
KW - SRAM
KW - Statistical analysis
KW - Sub-threshold slope
UR - http://www.scopus.com/inward/record.url?scp=84894551457&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84894551457&partnerID=8YFLogxK
U2 - 10.1109/VLSID.2014.75
DO - 10.1109/VLSID.2014.75
M3 - Conference contribution
AN - SCOPUS:84894551457
SN - 9781479925124
T3 - Proceedings of the IEEE International Conference on VLSI Design
SP - 399
EP - 404
BT - Proceedings - 27th International Conference on VLSI Design, VLSID 2014; Held Concurrently with 13th International Conference on Embedded Systems Design
T2 - 27th International Conference on VLSI Design, VLSID 2014 - Held Concurrently with 13th International Conference on Embedded Systems Design
Y2 - 5 January 2014 through 9 January 2014
ER -