Leveraging Circuit Reliability Effects for Designing Robust and Secure Physical Unclonable Functions

M. Kim, G. Park, P. Chiu, C. H. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Reliability mechanisms are undesirable from a product lifetime point of view, but their unique characteristics enable novel applications such as one-time-programmable memory, secure chip odometers, and physical unclonable functions (PUFs). In this invited paper, we will discuss how reliability mechanisms can be leveraged for the aforementioned applications, and then introduce a novel SRAM PUF design where the power up state of the SRAM cell is programmed into a local metal fuse using the electromigration phenomenon for improved stability.

Original languageEnglish (US)
Title of host publication2019 IEEE International Electron Devices Meeting, IEDM 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728140315
DOIs
StatePublished - Dec 2019
Event65th Annual IEEE International Electron Devices Meeting, IEDM 2019 - San Francisco, United States
Duration: Dec 7 2019Dec 11 2019

Publication series

NameTechnical Digest - International Electron Devices Meeting, IEDM
Volume2019-December
ISSN (Print)0163-1918

Conference

Conference65th Annual IEEE International Electron Devices Meeting, IEDM 2019
CountryUnited States
CitySan Francisco
Period12/7/1912/11/19

Bibliographical note

Funding Information:
ACKNOWLEDGMENT This work was supported in part by the Semiconductor Research Corporation (SRC) and the Texas Analog Center of Excellence (TxACE).

Publisher Copyright:
© 2019 IEEE.

Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.

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