Vectored IR drop analysis is a critical step in chip signoff that checks the power integrity of an on-chip power delivery network. Due to the prohibitive runtimes of dynamic IR drop analysis, the large number of test patterns must be whittled down to a small subset of worst-case IR vectors. Unlike the traditional slow heuristic method that select a few vectors with incomplete coverage, MAVIREC uses machine learning techniques-3D convolutions and regression-like layers-for accurately recommending a larger subset of test patterns that exercise worst-case scenarios. In under 30 minutes, MAVIREC profiles 100K-cycle vectors and provides better coverage than a state-of-the-art industrial flow. Further, MAVIREC's IR drop predictor shows 10X speedup with under 4mV Rmse relative to an industrial flow.
|Original language||English (US)|
|Title of host publication||Proceedings of the 2021 Design, Automation and Test in Europe, DATE 2021|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|Number of pages||4|
|State||Published - Feb 1 2021|
|Event||2021 Design, Automation and Test in Europe Conference and Exhibition, DATE 2021 - Virtual, Online|
Duration: Feb 1 2021 → Feb 5 2021
|Name||Proceedings -Design, Automation and Test in Europe, DATE|
|Conference||2021 Design, Automation and Test in Europe Conference and Exhibition, DATE 2021|
|Period||2/1/21 → 2/5/21|
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