MAVIREC: ML-Aided Vectored IR-Drop Estimation and Classification

Vidya A. Chhabria, Yanqing Zhang, Haoxing Ren, Ben Keller, Brucek Khailany, Sachin S. Sapatnekar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Vectored IR drop analysis is a critical step in chip signoff that checks the power integrity of an on-chip power delivery network. Due to the prohibitive runtimes of dynamic IR drop analysis, the large number of test patterns must be whittled down to a small subset of worst-case IR vectors. Unlike the traditional slow heuristic method that select a few vectors with incomplete coverage, MAVIREC uses machine learning techniques-3D convolutions and regression-like layers-for accurately recommending a larger subset of test patterns that exercise worst-case scenarios. In under 30 minutes, MAVIREC profiles 100K-cycle vectors and provides better coverage than a state-of-the-art industrial flow. Further, MAVIREC's IR drop predictor shows 10X speedup with under 4mV Rmse relative to an industrial flow.

Original languageEnglish (US)
Title of host publicationProceedings of the 2021 Design, Automation and Test in Europe, DATE 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1825-1828
Number of pages4
ISBN (Electronic)9783981926354
DOIs
StatePublished - Feb 1 2021
Event2021 Design, Automation and Test in Europe Conference and Exhibition, DATE 2021 - Virtual, Online
Duration: Feb 1 2021Feb 5 2021

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
Volume2021-February
ISSN (Print)1530-1591

Conference

Conference2021 Design, Automation and Test in Europe Conference and Exhibition, DATE 2021
CityVirtual, Online
Period2/1/212/5/21

Bibliographical note

Publisher Copyright:
© 2021 EDAA.

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