Measurement of rapid temperature profiles using thermoluminescent microparticles

Merlin L. Mah, Michael E. Manfred, Sangho S. Kim, Mirjana Prokić, Eduardo G. Yukihara, Joseph J. Talghader

Research output: Contribution to journalArticlepeer-review

26 Scopus citations

Abstract

The thermal history of a material with initially filled trap states may be probed using thermoluminescence. Since luminescent microparticles are composed of robust oxides, they are viable candidates for sensing temperature under conditions where all other types of direct-contact sensors fail. Mg 2SiO4 : Tb, Co particles with two thermoluminescent peaks have been heated using micromachined heaters over a 232 °C to 313 °C range on time scales of less than 200 ms. The effect of maximum temperature during excitation on the intensity ratio of the two luminescent peaks has been compared with first-order kinetics theory and shown to match within an average error of 4.4%.

Original languageEnglish (US)
Article number5361427
Pages (from-to)311-315
Number of pages5
JournalIEEE Sensors Journal
Volume10
Issue number2
DOIs
StatePublished - Feb 2010

Bibliographical note

Funding Information:
Manuscript received July 13, 2009; revised September 01, 2009; accepted September 16, 2009. Current version published December 28, 2009. This work was supported in part by the Defense Threat Reduction Agency (HDTRA1-07-1-0016). Parts of this work were performed at facilities in the NSF NNIN and MRFN programs. This is an expanded paper from the IEEE SENSORS 2009 Optical MEMS and Nanophotonics Conference. The associate editor coordinating the review of this paper and approving it for publication was Dr. Kailash Thakur.

Keywords

  • Microelectromechanical devices
  • Temperature measurement
  • Thermal history
  • Thermoluminescence (TL)

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