Measurement of rapid temperature profiles using thermoluminescent microparticles

Merlin L. Mah; Michael E. Manfred; Sangho S. Kim; Mirjana Prokić; Eduardo G. Yukihara; Joseph J. Talghader

doi:10.1109/JSEN.2009.2034023

Measurement of rapid temperature profiles using thermoluminescent microparticles

Merlin L. Mah, Michael E. Manfred, Sangho S. Kim, Mirjana Prokić, Eduardo G. Yukihara, Joseph J. Talghader

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

29 Scopus citations

Abstract

The thermal history of a material with initially filled trap states may be probed using thermoluminescence. Since luminescent microparticles are composed of robust oxides, they are viable candidates for sensing temperature under conditions where all other types of direct-contact sensors fail. Mg ₂SiO₄ : Tb, Co particles with two thermoluminescent peaks have been heated using micromachined heaters over a 232 °C to 313 °C range on time scales of less than 200 ms. The effect of maximum temperature during excitation on the intensity ratio of the two luminescent peaks has been compared with first-order kinetics theory and shown to match within an average error of 4.4%.

Original language	English (US)
Article number	5361427
Pages (from-to)	311-315
Number of pages	5
Journal	IEEE Sensors Journal
Volume	10
Issue number	2
DOIs	https://doi.org/10.1109/JSEN.2009.2034023
State	Published - Feb 2010

Bibliographical note

Funding Information:
Manuscript received July 13, 2009; revised September 01, 2009; accepted September 16, 2009. Current version published December 28, 2009. This work was supported in part by the Defense Threat Reduction Agency (HDTRA1-07-1-0016). Parts of this work were performed at facilities in the NSF NNIN and MRFN programs. This is an expanded paper from the IEEE SENSORS 2009 Optical MEMS and Nanophotonics Conference. The associate editor coordinating the review of this paper and approving it for publication was Dr. Kailash Thakur.

Keywords

Microelectromechanical devices
Temperature measurement
Thermal history
Thermoluminescence (TL)

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@article{d31477daa8984e2da22d5535a0ca78b8,

title = "Measurement of rapid temperature profiles using thermoluminescent microparticles",

abstract = "The thermal history of a material with initially filled trap states may be probed using thermoluminescence. Since luminescent microparticles are composed of robust oxides, they are viable candidates for sensing temperature under conditions where all other types of direct-contact sensors fail. Mg 2SiO4 : Tb, Co particles with two thermoluminescent peaks have been heated using micromachined heaters over a 232 °C to 313 °C range on time scales of less than 200 ms. The effect of maximum temperature during excitation on the intensity ratio of the two luminescent peaks has been compared with first-order kinetics theory and shown to match within an average error of 4.4%.",

keywords = "Microelectromechanical devices, Temperature measurement, Thermal history, Thermoluminescence (TL)",

author = "Mah, {Merlin L.} and Manfred, {Michael E.} and Kim, {Sangho S.} and Mirjana Proki{\'c} and Yukihara, {Eduardo G.} and Talghader, {Joseph J.}",

note = "Funding Information: Manuscript received July 13, 2009; revised September 01, 2009; accepted September 16, 2009. Current version published December 28, 2009. This work was supported in part by the Defense Threat Reduction Agency (HDTRA1-07-1-0016). Parts of this work were performed at facilities in the NSF NNIN and MRFN programs. This is an expanded paper from the IEEE SENSORS 2009 Optical MEMS and Nanophotonics Conference. The associate editor coordinating the review of this paper and approving it for publication was Dr. Kailash Thakur.",

year = "2010",

month = feb,

doi = "10.1109/JSEN.2009.2034023",

language = "English (US)",

volume = "10",

pages = "311--315",

journal = "IEEE Sensors Journal",

issn = "1530-437X",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "2",

}

TY - JOUR

T1 - Measurement of rapid temperature profiles using thermoluminescent microparticles

AU - Mah, Merlin L.

AU - Manfred, Michael E.

AU - Kim, Sangho S.

AU - Prokić, Mirjana

AU - Yukihara, Eduardo G.

AU - Talghader, Joseph J.

N1 - Funding Information: Manuscript received July 13, 2009; revised September 01, 2009; accepted September 16, 2009. Current version published December 28, 2009. This work was supported in part by the Defense Threat Reduction Agency (HDTRA1-07-1-0016). Parts of this work were performed at facilities in the NSF NNIN and MRFN programs. This is an expanded paper from the IEEE SENSORS 2009 Optical MEMS and Nanophotonics Conference. The associate editor coordinating the review of this paper and approving it for publication was Dr. Kailash Thakur.

PY - 2010/2

Y1 - 2010/2

N2 - The thermal history of a material with initially filled trap states may be probed using thermoluminescence. Since luminescent microparticles are composed of robust oxides, they are viable candidates for sensing temperature under conditions where all other types of direct-contact sensors fail. Mg 2SiO4 : Tb, Co particles with two thermoluminescent peaks have been heated using micromachined heaters over a 232 °C to 313 °C range on time scales of less than 200 ms. The effect of maximum temperature during excitation on the intensity ratio of the two luminescent peaks has been compared with first-order kinetics theory and shown to match within an average error of 4.4%.

AB - The thermal history of a material with initially filled trap states may be probed using thermoluminescence. Since luminescent microparticles are composed of robust oxides, they are viable candidates for sensing temperature under conditions where all other types of direct-contact sensors fail. Mg 2SiO4 : Tb, Co particles with two thermoluminescent peaks have been heated using micromachined heaters over a 232 °C to 313 °C range on time scales of less than 200 ms. The effect of maximum temperature during excitation on the intensity ratio of the two luminescent peaks has been compared with first-order kinetics theory and shown to match within an average error of 4.4%.

KW - Microelectromechanical devices

KW - Temperature measurement

KW - Thermal history

KW - Thermoluminescence (TL)

UR - http://www.scopus.com/inward/record.url?scp=73849099357&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=73849099357&partnerID=8YFLogxK

U2 - 10.1109/JSEN.2009.2034023

DO - 10.1109/JSEN.2009.2034023

M3 - Article

AN - SCOPUS:73849099357

SN - 1530-437X

VL - 10

SP - 311

EP - 315

JO - IEEE Sensors Journal

JF - IEEE Sensors Journal

IS - 2

M1 - 5361427

ER -

Measurement of rapid temperature profiles using thermoluminescent microparticles

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Keywords

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