Abstract
Opposite polarity magnetic force microscope (MFM) profiles of domain walls (DWs) in magnetite were measured with a commercial MFM tip magnetized in opposite directions perpendicular to the sample surface. The influence of the tip field on a DW resulted in an overall more attractive interaction. The difference between opposite polarity DW profiles provided a qualitative measurement of the reversible changes in DW structure due to the localized field of the MFM tip. The dependence of the measured alteration on tip-sample separation was fit with a power law at different positions across the DW. The rate of decay of the alteration with tip-sample separation, quantified by the exponent of the power law fit, varied across the DW and was much slower than expected from a simple model.
Original language | English (US) |
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Pages (from-to) | 5032-5034 |
Number of pages | 3 |
Journal | Journal of Applied Physics |
Volume | 81 |
Issue number | 8 PART 2B |
DOIs | |
State | Published - Apr 15 1997 |