Abstract
We investigate the polarization dependence of photoemission from polycrystalline CsI under excitation by linearly polarized 2.69-keV x rays. We measure the electron pulse yield as a function of polarization state for grazing incidence angles between 5°and 18°. No dependence on the incident polarization is found. We find an upper limit of 1.1%, at the 99.99% statistical confidence level, on the fractional change in the pulse yield. Allowing for worst-case systematic uncertainties, we place an upper bound of 3.6% on the difference in the secondary electron pulse yield between the two polarization states.
Original language | English (US) |
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Pages (from-to) | 701-709 |
Number of pages | 9 |
Journal | Physical Review B |
Volume | 48 |
Issue number | 2 |
DOIs | |
State | Published - 1993 |
Bibliographical note
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