Measurement of the electron yield of CsI with polarized x rays

S. Hanany, P. S. Shaw, Y. Liu, A. Santangelo, P. Kaaret, R. Novick

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

We investigate the polarization dependence of photoemission from polycrystalline CsI under excitation by linearly polarized 2.69-keV x rays. We measure the electron pulse yield as a function of polarization state for grazing incidence angles between 5°and 18°. No dependence on the incident polarization is found. We find an upper limit of 1.1%, at the 99.99% statistical confidence level, on the fractional change in the pulse yield. Allowing for worst-case systematic uncertainties, we place an upper bound of 3.6% on the difference in the secondary electron pulse yield between the two polarization states.

Original languageEnglish (US)
Pages (from-to)701-709
Number of pages9
JournalPhysical Review B
Volume48
Issue number2
DOIs
StatePublished - Jan 1 1993

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