Measuring dynamic phenomena at the sub-micron scale

Julio Soria, Omid Amili, Callum Atkinson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

measuring the spatio-temporal evolution of dynamic phenomena at sub-micron level is non-trivial due to the diffraction limit of optical systems. This paper describes a technique which allows imaging of sub-micron features of fluid-based phenomena, specifically the determination of their velocity and trajectory.

Original languageEnglish (US)
Title of host publicationProceedings of the 2008 International Conference on Nanoscience and Nanotechnology, ICONN 2008
Pages129-132
Number of pages4
DOIs
StatePublished - Nov 24 2008
Event2008 International Conference on Nanoscience and Nanotechnology, ICONN 2008 - Melbourne, VIC, Australia
Duration: Feb 25 2008Feb 29 2008

Publication series

NameProceedings of the 2008 International Conference on Nanoscience and Nanotechnology, ICONN 2008

Other

Other2008 International Conference on Nanoscience and Nanotechnology, ICONN 2008
CountryAustralia
CityMelbourne, VIC
Period2/25/082/29/08

Keywords

  • Component; sub-micron phenomena
  • Dynamics
  • Holography
  • PIV

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