Measuring the Thickness and Potential Profiles of the Space-Charge Layer at Organic/Organic Interfaces under Illumination and in the Dark by Scanning Kelvin Probe Microscopy

Geoffrey A. Rojas, Yanfei Wu, Greg Haugstad, C. Daniel Frisbie

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

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Engineering & Materials Science

Chemical Compounds