MEMESTAR: A simulation framework for reliability evaluation over multiple environments

Christian J. Hescott, Drew C. Ness, David J Lilja

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

We present a methodology for the simulation of soft errors targeting future nano-technological devices. This approach efficiently scales the failure rate of individual devices according to cell area and considers the effect of multiple faults within a circuit. Furthermore this methodology measures circuit operation over a range of environments and consequently provides a means of targeting designs to the expected operating environment rather than worst case. We demonstrate the effect area has on circuit reliability and fault tolerance.

Original languageEnglish (US)
Title of host publicationProceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007
Pages917-922
Number of pages6
DOIs
StatePublished - Aug 28 2007
Event8th International Symposium on Quality Electronic Design, ISQED 2007 - San Jose, CA, United States
Duration: Mar 26 2007Mar 28 2007

Publication series

NameProceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007

Conference

Conference8th International Symposium on Quality Electronic Design, ISQED 2007
Country/TerritoryUnited States
CitySan Jose, CA
Period3/26/073/28/07

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