@inproceedings{9247c60fe9b54c618ff43ba6472f1d61,
title = "MEMESTAR: A simulation framework for reliability evaluation over multiple environments",
abstract = "We present a methodology for the simulation of soft errors targeting future nano-technological devices. This approach efficiently scales the failure rate of individual devices according to cell area and considers the effect of multiple faults within a circuit. Furthermore this methodology measures circuit operation over a range of environments and consequently provides a means of targeting designs to the expected operating environment rather than worst case. We demonstrate the effect area has on circuit reliability and fault tolerance.",
author = "Hescott, {Christian J.} and Ness, {Drew C.} and Lilja, {David J.}",
year = "2007",
doi = "10.1109/ISQED.2007.101",
language = "English (US)",
isbn = "0769527957",
series = "Proceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007",
pages = "917--922",
booktitle = "Proceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007",
note = "8th International Symposium on Quality Electronic Design, ISQED 2007 ; Conference date: 26-03-2007 Through 28-03-2007",
}