Micromagnetic specification for bit patterned recording at 4 Tbit/in 2

Yan Dong, R. H. Victora

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

Micromagnetic specifications including 2.3:1 BAR bit patterned ECC media, trailing shield, and side shields are proposed to meet the requirement of 3 × 10- 4 bit error rate, 4 nm fly height, 5% switching field distribution, 5% timing, and 5% jitter errors for 4 Tbit/in2 bit patterned recording. Demagnetizing field distribution is examined by studying the shielding effect of the side shields on the stray field from the neighboring dots. It is shown that, as the fly height is increased to 5 nm, head field and field gradient degradation will require a larger BAR (2.7:1) and a larger bit error rate to achieve the same areal density.

Original languageEnglish (US)
Article number6028181
Pages (from-to)2652-2655
Number of pages4
JournalIEEE Transactions on Magnetics
Volume47
Issue number10
DOIs
StatePublished - Oct 2011

Bibliographical note

Funding Information:
The authors would like to thank the INSIC leadership team for valuable discussions. This work was supported by INSIC EHDR and IDEMA/ASTC.

Keywords

  • Bit error rate
  • bit patterned media
  • exchange coupled composite (ECC) media
  • micromagnetic simulation

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