TY - JOUR
T1 - Microscale and nanoscale strain mapping techniques applied to creep of rocks
AU - Quintanilla-Terminel, Alejandra
AU - Zimmerman, Mark E.
AU - Evans, Brian
AU - Kohlstedt, David L.
N1 - Funding Information:
Support through NSF grants EAR-1520647 (UMN) and 145122 (MIT) is gratefully acknowledged.
Publisher Copyright:
© Author(s) 2017.
PY - 2017/7/10
Y1 - 2017/7/10
N2 - Usually several deformation mechanisms interact to accommodate plastic deformation. Quantifying the contribution of each to the total strain is necessary to bridge the gaps from observations of microstructures, to geomechanical descriptions, to extrapolating from laboratory data to field observations. Here, we describe the experimental and computational techniques involved in microscale strain mapping (MSSM), which allows strain produced during highpressure, high-temperature deformation experiments to be tracked with high resolution. MSSM relies on the analysis of the relative displacement of initially regularly spaced markers after deformation. We present two lithography techniques used to pattern rock substrates at different scales: photolithography and electron-beam lithography. Further, we discuss the challenges of applying the MSSM technique to samples used in high-temperature and high-pressure experiments. We applied the MSSM technique to a study of strain partitioning during creep of Carrara marble and grain boundary sliding in San Carlos olivine, synthetic forsterite, and Solnhofen limestone at a confining pressure, Pc, of 300MPa and homologous temperatures, T =Tm, of 0.3 to 0.6. The MSSM technique works very well up to temperatures of 700 °C. The experimental developments described here show promising results for higher-temperature applications.
AB - Usually several deformation mechanisms interact to accommodate plastic deformation. Quantifying the contribution of each to the total strain is necessary to bridge the gaps from observations of microstructures, to geomechanical descriptions, to extrapolating from laboratory data to field observations. Here, we describe the experimental and computational techniques involved in microscale strain mapping (MSSM), which allows strain produced during highpressure, high-temperature deformation experiments to be tracked with high resolution. MSSM relies on the analysis of the relative displacement of initially regularly spaced markers after deformation. We present two lithography techniques used to pattern rock substrates at different scales: photolithography and electron-beam lithography. Further, we discuss the challenges of applying the MSSM technique to samples used in high-temperature and high-pressure experiments. We applied the MSSM technique to a study of strain partitioning during creep of Carrara marble and grain boundary sliding in San Carlos olivine, synthetic forsterite, and Solnhofen limestone at a confining pressure, Pc, of 300MPa and homologous temperatures, T =Tm, of 0.3 to 0.6. The MSSM technique works very well up to temperatures of 700 °C. The experimental developments described here show promising results for higher-temperature applications.
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U2 - 10.5194/se-8-751-2017
DO - 10.5194/se-8-751-2017
M3 - Article
AN - SCOPUS:85022175422
SN - 1869-9510
VL - 8
SP - 751
EP - 765
JO - Solid Earth
JF - Solid Earth
IS - 4
ER -