TY - GEN
T1 - Modeling failure reduction for combinational logic using gate level NMR
AU - Ness, Drew C.
AU - Hescott, Christian J.
AU - Lilja, David J
N1 - Copyright:
Copyright 2011 Elsevier B.V., All rights reserved.
PY - 2007
Y1 - 2007
N2 - We present a mathematical model for describing the relationship between overhead and error reduction under single-error conditions in combinational logic using Nmodular redundancy (NMR) as an upper bound. We then provide an analysis for the model under more realistic circuit and overhead assumptions. We compare system, sub-circuit, and gate level NMR. Based on our results, implementing NMR at the gate level offers the benefits of NMR with customizable overheads but with reduced effectiveness when compared to system level implementations.
AB - We present a mathematical model for describing the relationship between overhead and error reduction under single-error conditions in combinational logic using Nmodular redundancy (NMR) as an upper bound. We then provide an analysis for the model under more realistic circuit and overhead assumptions. We compare system, sub-circuit, and gate level NMR. Based on our results, implementing NMR at the gate level offers the benefits of NMR with customizable overheads but with reduced effectiveness when compared to system level implementations.
KW - Fault-tolerance
KW - N modular redundancy
KW - Soft errors
UR - http://www.scopus.com/inward/record.url?scp=34547283382&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=34547283382&partnerID=8YFLogxK
U2 - 10.1109/RAMS.2007.328120
DO - 10.1109/RAMS.2007.328120
M3 - Conference contribution
AN - SCOPUS:34547283382
SN - 0780397665
SN - 9780780397668
T3 - 2007 Proceedings - Annual Reliability and Maintainability Symposium, RAMS
SP - 208
EP - 213
BT - 2007 Proceedings - Annual Reliability and Maintainability Symposium, RAMS
T2 - 2007 53rd Annual Reliability and Maintainability Sympsoium, RAMS
Y2 - 22 January 2006 through 25 January 2006
ER -