Abstract
An outline is presented of methods for designing monitor circuits that can be used to test any general microprogrammed control unit (MCU) concurrently. The basic monitor, tailormade for a given MCU, uses a circuit that generates keys of check bits and compares them to those stored in each microinstruction (state). The keys are defined over states within the MCU, described as a sequential machine by a flow table. A spectrum of monitors can be designed with different complexities determined by the method of generating the keys. The most complex design uses a mapping function feedback shift-register for key generation. An intermediate design combines both approaches to predict keys. The general monitor can be designed to detect any fault in a specified fault set.
| Original language | English (US) |
|---|---|
| Title of host publication | Unknown Host Publication Title |
| Publisher | IEEE |
| Pages | 137-139 |
| Number of pages | 3 |
| State | Published - Dec 1 1984 |