Monte carlo method for electromagnetic scattering incorporating finite element methods to generate scatter sources for nanoscale inclusions in composites

Erik D. Sapper, Brian R. Hinderliter

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Scattering of electromagnetic waves by a composite has a significant impact on its perceived quality, and has been used as a nondestructive measurement surrogate for the health of polymeric composites. Electromagnetic wave scattering is used to estimate flaw size distribution, used as input in calculating fracture failure due to stress concentration. Light scattering from the surface (specular) and reemerging from within a coating (diffuse) is a function of wavelength and the weighted integral of these terms gives the gloss and color of a material, particularly relevant for coatings. Monte Carlo ray tracing is a stochastic computational method used to calculate the transport of electromagnetic waves, with a finite element solution of nanoparticle scattering used to generate a surface source for particles below the geometric optics limit. A 3-dimensional Monte Carlo/FEA model is being developed, capable of analyzing scattering by composites containing scatterers comparable to or smaller than the wavelength of incident light.

Original languageEnglish (US)
Title of host publicationTMS 2010 - 139th Annual Meeting and Exhibition - Supplemental Proceedings
Pages577-584
Number of pages8
StatePublished - May 28 2010
EventTMS 2010 - 139th Annual Meeting and Exhibition - Seattle, WA, United States
Duration: Feb 14 2010Feb 18 2010

Publication series

NameTMS Annual Meeting
Volume2

Other

OtherTMS 2010 - 139th Annual Meeting and Exhibition
Country/TerritoryUnited States
CitySeattle, WA
Period2/14/102/18/10

Keywords

  • Electromagnetic radiation scattering
  • Finite element methods
  • Lorenz-Mie scattering theory
  • Monte Carlo method
  • Polymer composites

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