Multiple scattering analysis of reflection high-energy electron diffraction intensities from GaAs(110)

S. Y. Tong, T. C. Zhao, H. C. Poon, K. D. Jamison, D. N. Zhou, P. I. Cohen

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Abstract

An accurate and fast dynamical theory for calculating reflection high-energy electron diffraction (RHEED) rocking-curve intensities at 10-40 keV is presented. The application of RHEED to surface structural analysis is demonstrated for the first time on a reconstructed surface by comparing data to calculated spectra for GaAs(110). The technique is highly sensitive to structural changes along specific directions due to its forward-scattering geometry.

Original languageEnglish (US)
Pages (from-to)447-450
Number of pages4
JournalPhysics Letters A
Volume128
Issue number8
DOIs
StatePublished - Apr 18 1988

Bibliographical note

Funding Information:
We thank Drs. S. Nagano, Y. Huang and K.A. Feng for programming help. Special thanks go to Dr. C. Schwartz for discussions concerning the R-matrix method. Dr. P.R. Pukite assisted in the data acquisition and analysis. This work is supported by NSF, Grants DMR-8405049 and DMR-8615207 and NCSA, Illinois.

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