Multiple scattering analysis of reflection high-energy electron diffraction intensities from GaAs(110)

S. Y. Tong; T. C. Zhao; H. C. Poon; K. D. Jamison; D. N. Zhou; P. I. Cohen

doi:10.1016/0375-9601(88)90128-4

Multiple scattering analysis of reflection high-energy electron diffraction intensities from GaAs(110)

S. Y. Tong, T. C. Zhao, H. C. Poon, K. D. Jamison, D. N. Zhou, P. I. Cohen

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

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Abstract

An accurate and fast dynamical theory for calculating reflection high-energy electron diffraction (RHEED) rocking-curve intensities at 10-40 keV is presented. The application of RHEED to surface structural analysis is demonstrated for the first time on a reconstructed surface by comparing data to calculated spectra for GaAs(110). The technique is highly sensitive to structural changes along specific directions due to its forward-scattering geometry.

Original language	English (US)
Pages (from-to)	447-450
Number of pages	4
Journal	Physics Letters A
Volume	128
Issue number	8
DOIs	https://doi.org/10.1016/0375-9601(88)90128-4
State	Published - Apr 18 1988

Bibliographical note

Funding Information:
We thank Drs. S. Nagano, Y. Huang and K.A. Feng for programming help. Special thanks go to Dr. C. Schwartz for discussions concerning the R-matrix method. Dr. P.R. Pukite assisted in the data acquisition and analysis. This work is supported by NSF, Grants DMR-8405049 and DMR-8615207 and NCSA, Illinois.

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title = "Multiple scattering analysis of reflection high-energy electron diffraction intensities from GaAs(110)",

abstract = "An accurate and fast dynamical theory for calculating reflection high-energy electron diffraction (RHEED) rocking-curve intensities at 10-40 keV is presented. The application of RHEED to surface structural analysis is demonstrated for the first time on a reconstructed surface by comparing data to calculated spectra for GaAs(110). The technique is highly sensitive to structural changes along specific directions due to its forward-scattering geometry.",

author = "Tong, {S. Y.} and Zhao, {T. C.} and Poon, {H. C.} and Jamison, {K. D.} and Zhou, {D. N.} and Cohen, {P. I.}",

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T1 - Multiple scattering analysis of reflection high-energy electron diffraction intensities from GaAs(110)

AU - Tong, S. Y.

AU - Zhao, T. C.

AU - Poon, H. C.

AU - Jamison, K. D.

AU - Zhou, D. N.

AU - Cohen, P. I.

N1 - Funding Information: We thank Drs. S. Nagano, Y. Huang and K.A. Feng for programming help. Special thanks go to Dr. C. Schwartz for discussions concerning the R-matrix method. Dr. P.R. Pukite assisted in the data acquisition and analysis. This work is supported by NSF, Grants DMR-8405049 and DMR-8615207 and NCSA, Illinois.

PY - 1988/4/18

Y1 - 1988/4/18

N2 - An accurate and fast dynamical theory for calculating reflection high-energy electron diffraction (RHEED) rocking-curve intensities at 10-40 keV is presented. The application of RHEED to surface structural analysis is demonstrated for the first time on a reconstructed surface by comparing data to calculated spectra for GaAs(110). The technique is highly sensitive to structural changes along specific directions due to its forward-scattering geometry.

AB - An accurate and fast dynamical theory for calculating reflection high-energy electron diffraction (RHEED) rocking-curve intensities at 10-40 keV is presented. The application of RHEED to surface structural analysis is demonstrated for the first time on a reconstructed surface by comparing data to calculated spectra for GaAs(110). The technique is highly sensitive to structural changes along specific directions due to its forward-scattering geometry.

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Multiple scattering analysis of reflection high-energy electron diffraction intensities from GaAs(110)

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