Nature of layer-by-layer freezing in free-standing 4O.8 Films

Chih Yu Chao, Chia Fu Chou, John T. Ho, S. W. Hui, Anjun Jin, Cheng-Cher Huang

Research output: Contribution to journalArticlepeer-review

44 Scopus citations


Electron diffraction has been conducted in thin free-standing films of N-(4-n-butoxybenzylidene)-4-n-octylaniline (4O.8). The surface smectic-A layers first exhibit a transition to the hexatic-B phase at a temperature where a strong heat-capacity anomaly has been observed, and then undergo a second transition to the crystal-B phase. The surface hexatic-B-crystal-B transition is not accompanied by any detectable thermal signature, but coincides with the onset of shear response. This smectic-A–hexatic-B–crystal-B transition sequence is then repeated in the interior of the films in a novel layer-by-layer manner.

Original languageEnglish (US)
Pages (from-to)2750-2753
Number of pages4
JournalPhysical Review Letters
Issue number13
StatePublished - Jan 1 1996

Fingerprint Dive into the research topics of 'Nature of layer-by-layer freezing in free-standing 4O.8 Films'. Together they form a unique fingerprint.

Cite this