NEGF analysis of InGaAs schottky barrier double gate MOSFETs

Himadri S. Pal, Tony Low, Mark S. Lundstrom

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

17 Scopus citations

Fingerprint

Dive into the research topics of 'NEGF analysis of InGaAs schottky barrier double gate MOSFETs'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy