Observation of Si nanocrystals by spherical-aberration corrected transmission electron microscopy

Christopher R. Perrey, Julia M. Deneen, Siri S. Thompson, Markus Lentzen, Uwe Kortshagen, C. Barry Carter

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)996-997
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Sep 24 2004

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