Observation of Si nanocrystals by spherical-aberration corrected transmission electron microscopy

Christopher R. Perrey; Julia M. Deneen; Siri S. Thompson; Markus Lentzen; Uwe Kortshagen; C. Barry Carter

doi:10.1017/S1431927604884976

Observation of Si nanocrystals by spherical-aberration corrected transmission electron microscopy

Christopher R. Perrey, Julia M. Deneen, Siri S. Thompson, Markus Lentzen, Uwe Kortshagen, C. Barry Carter

Mechanical Engineering

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	996-997
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	10
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927604884976
State	Published - Sep 24 2004

Access

10.1017/S1431927604884976

OpenUrl availability

Full text

Cite this

@article{c9820b9e991f4e4fbda3e19b13adc2f8,

title = "Observation of Si nanocrystals by spherical-aberration corrected transmission electron microscopy",

author = "Perrey, {Christopher R.} and Deneen, {Julia M.} and Thompson, {Siri S.} and Markus Lentzen and Uwe Kortshagen and Carter, {C. Barry}",

year = "2004",

month = sep,

day = "24",

doi = "10.1017/S1431927604884976",

language = "English (US)",

volume = "10",

pages = "996--997",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Observation of Si nanocrystals by spherical-aberration corrected transmission electron microscopy

AU - Perrey, Christopher R.

AU - Deneen, Julia M.

AU - Thompson, Siri S.

AU - Lentzen, Markus

AU - Kortshagen, Uwe

AU - Carter, C. Barry

PY - 2004/9/24

Y1 - 2004/9/24

UR - http://www.scopus.com/inward/record.url?scp=4544272720&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=4544272720&partnerID=8YFLogxK

U2 - 10.1017/S1431927604884976

DO - 10.1017/S1431927604884976

M3 - Article

AN - SCOPUS:4544272720

SN - 1431-9276

VL - 10

SP - 996

EP - 997

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Observation of Si nanocrystals by spherical-aberration corrected transmission electron microscopy

Access

OpenUrl availability

Other files and links

Cite this