@inproceedings{e68fb7e4973c4eaea9fe7efc154e8ac5,
title = "Optical characterization of van der Waals materials via near-field microscopy",
abstract = "We demonstrate a novel characterization method of van-der-Waals' materials by performing near-field-microscopy of hexagonal-boron-nitride thin films on single-crystal silver. Beyond determining dispersion of optical modes, this technique also enables the direct study of light-matter interactions.",
author = "Daniel Wintz and Zhu, {Alexander Y.} and Ke Wang and Antonio Ambrosio and Rob Devlin and Jesse Crossno and Philip Kim and Federico Capasso",
year = "2016",
month = dec,
day = "16",
language = "English (US)",
series = "2016 Conference on Lasers and Electro-Optics, CLEO 2016",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2016 Conference on Lasers and Electro-Optics, CLEO 2016",
note = "2016 Conference on Lasers and Electro-Optics, CLEO 2016 ; Conference date: 05-06-2016 Through 10-06-2016",
}