Abstract
A null transmission ellipsometry study on free standing films of a band-core compound was reported. The critical exponent associated with the biaxiality through the uniaxial-antiferoelectric biaxial Sm A transition was measured to be 0.82±0.04. It was demonstrated that the critical behavior of the optical biaxiality with the order parameter being a vector was described by the secondary-order parameter of the three-dimensional XY model. A remarkable even-odd layering effect exhibited by the surface layers of freestanding films under an applied electric field in the film plane was also observed.
Original language | English (US) |
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Article number | 061705 |
Pages (from-to) | 061705-1-061705-6 |
Journal | Physical Review E - Statistical, Nonlinear, and Soft Matter Physics |
Volume | 70 |
Issue number | 6 1 |
DOIs | |
State | Published - Dec 1 2004 |