TY - JOUR
T1 - Parametric and nonparametric FDR estimation revisited
AU - Wu, Baolin
AU - Guan, Zhong
AU - Zhao, Hongyu
PY - 2006/9
Y1 - 2006/9
N2 - Nonparametric and parametric approaches have been proposed to estimate false discovery rate under the independent hypothesis testing assumption. The parametric approach has been shown to have better performance than the nonparametric approaches. In this article, we study the nonparametric approaches and quantify the underlying relations between parametric and nonparametric approaches. Our study reveals the conservative nature of the nonparametric approaches, and establishes the connections between the empirical Bayes method and p-value-based nonparametric methods. Based on our results, we advocate using the parametric approach, or directly modeling the test statistics using the empirical Bayes method.
AB - Nonparametric and parametric approaches have been proposed to estimate false discovery rate under the independent hypothesis testing assumption. The parametric approach has been shown to have better performance than the nonparametric approaches. In this article, we study the nonparametric approaches and quantify the underlying relations between parametric and nonparametric approaches. Our study reveals the conservative nature of the nonparametric approaches, and establishes the connections between the empirical Bayes method and p-value-based nonparametric methods. Based on our results, we advocate using the parametric approach, or directly modeling the test statistics using the empirical Bayes method.
KW - Empirical Bayes method
KW - False discovery rate
KW - Microarray
KW - Multiple comparisons
KW - Multiple hypothesis testing
KW - Simultaneous inference
UR - http://www.scopus.com/inward/record.url?scp=33748780360&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33748780360&partnerID=8YFLogxK
U2 - 10.1111/j.1541-0420.2006.00531.x
DO - 10.1111/j.1541-0420.2006.00531.x
M3 - Article
C2 - 16984315
AN - SCOPUS:33748780360
SN - 0006-341X
VL - 62
SP - 735
EP - 744
JO - Biometrics
JF - Biometrics
IS - 3
ER -