Plastic instability mechanisms in bimetallic nanolayered composites

S. J. Zheng, J. Wang, J. S. Carpenter, W. M. Mook, P. O. Dickerson, N. A. Mara, I. J. Beyerlein

Research output: Contribution to journalArticlepeer-review

67 Scopus citations

Abstract

Strain localization is a common deformation-induced instability in many metallic metals. How it happens is related to both microstructure and the way in which plasticity is mediated prior to localization. Both aspects can fundamentally change in a face-centered cubic metal when it becomes nanostructured; the propensity for deformation twinning increases and the behavior is dominated by dislocation-interface interactions. Here we carry out a transmission electron microscopy investigation to elucidate the collaborative role of deformation twinning and dislocation transmission on the onset of strain localization in nanolayered composites. Two material systems are examined, Cu-Ag and Cu-Nb, and for each system, two interface structures are examined, one prone to dislocation transmission and the other not. We show that dislocation transmission favors crystallographic band formation, whereas dislocations that do not transmit cause interface tilting and are associated with (non-crystallographic) shear band formation.

Original languageEnglish (US)
Pages (from-to)282-291
Number of pages10
JournalActa Materialia
Volume79
DOIs
StatePublished - Aug 19 2014

Bibliographical note

Funding Information:
This work is supported by the Center for Materials at Irradiation and Mechanical Extremes , an Energy Frontier Research Center funded by the US Department of Energy, Office of Science, Office of Basic Energy Sciences under Award No. 2008LANL1026 . This work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the US Department of Energy (DOE) Office of Science. Los Alamos National Laboratory, an affirmative action equal opportunity employer, is operated by Los Alamos National Security, LLC, for the National Nuclear Security Administration of the US Department of Energy under contract DE-AC52-06NA25396 . The authors thank Dr. Shuai Shao, Dr. Youxing Chen, and Prof. John P. Hirth for helpful discussions.

Keywords

  • Interfaces
  • Nanolayered composites
  • Shear bands
  • TEM
  • Twinning

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