Conducting probe atomic force microscopy was demonstrated to provide reproducible point-contact measurements of the current-voltage characteristics of single grains of the organic semiconductors. Au-coated AFM probes were used to identify individual sexithiophene grains ranging from 1 to 6 molecules in thickness. Analysis of the measured current-voltage curves allows estimation of the grain resistivity, carrier density, contact resistance, and the effective barrier height.
|Original language||English (US)|
|Number of pages||4|
|Journal||Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures|
|State||Published - Mar 1 2000|