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Post-Si CMOS: III-V n-MOSFETs with high-k gate dielectrics
Yanning Sun, S. J. Koester, E. W. Kiewra, J. P. De Souza, N. Ruiz, J. J. Bucchignano, A. Callegari, K. E. Fogel, D. K. Sadana, J. Fompeyrine, D. J. Webb, J. P. Locquet, M. Sousa, R. Germann
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
3
Scopus
citations