Predicting temperature increase through local SAR estimation by B1 mapping: A phantom validation at 7T

Xiaotong Zhang, Jiaen Liu, Sebastian Schmitter, Pierre-Francois Van de Moortele, Bin He

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Abstract

It has been shown that Electrical Properties d(EPs) of biological tissues can be derived from MR-based B1 measurement. A strong appeal for these 'Electrical Property Tomography' (EPT) methods is to estimate real-time and subject-specific local specific absorption rate (SAR) induced by RF transmission. In order to investigate the feasibility of EPT-based local SAR estimation, following previously proposed EPT protocols, induced local SAR has been firstly estimated under one B1 shim setting for a heating sequence at 7T; whereas with the same acquired B1 information, induced local SAR under a different B1 shim setting has been further predicted. Both of the SAR results have been compared to measured temperature changes using MRI Thermometry based on the proton chemical shift.

Original languageEnglish (US)
Title of host publication2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1107-1110
Number of pages4
Volume2014
ISBN (Electronic)9781424479290
DOIs
StatePublished - Jan 1 2014
Event2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014 - Chicago, United States
Duration: Aug 26 2014Aug 30 2014

Publication series

NameConference proceedings : ... Annual International Conference of the IEEE Engineering in Medicine and Biology Society. IEEE Engineering in Medicine and Biology Society. Annual Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISSN (Print)1557-170X

Other

Other2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2014
Country/TerritoryUnited States
CityChicago
Period8/26/148/30/14

Bibliographical note

Publisher Copyright:
© 2014 IEEE.

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