Original language | English (US) |
---|---|
Title of host publication | Electromigration Inside Logic Cells |
Subtitle of host publication | Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS |
Publisher | Springer International Publishing |
Pages | v-vi |
ISBN (Electronic) | 9783319488998 |
ISBN (Print) | 9783319488981 |
DOIs | |
State | Published - Jan 1 2016 |
Preface
Gracieli Posser, Sachin S Sapatnekar, Ricardo Reis
Research output: Chapter in Book/Report/Conference proceeding › Foreword/postscript